标准编号: IEC 60749-11-2002
中文标准名称: 半导体器件.机械和气候试验方法.第11部分: 温度的急速变化.双液电镀槽法
代替标准号: IEC 47/1535A/CDV-2000;IEC 47/1605/FDIS-2002;IEC 60749-1996;IEC 60749 AMD 1-2000;IEC 60749 AMD 2-2001;IEC 60749 Edition 2.2-2002;IEC/PAS 62185-2000,
标准简介:
defines the rapid change of temperature test method and the two-fluid-bath method. this test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. this test is applicable to all semiconductor devices. it is considered destructive unless otherwise detailed in the relevant specification.
中国标准分类号: L40
